SESSION F1:  Residual Stresses I

10:30 AM Keynote
Meeting The Challenges In X-Ray Residual Stress Analysis Of Thin Film Structures
Ch. Genzel, Helmholtz Centre Berlin for Materials and Energy, Germany

11:00 AM
*A Study On Area Detector Type Diffraction Stress Mearsurement And Its Application To Shelling Problem In Railway Tracks
Toshihiko Sasaki, Osamu Yaguchi, Yuichi Kobayashi, Kanazawa University, Japan

11:20 AM
Internal Distribution Of Residual Stresses In Fiber Laser Welded Materials Using A Minute Metal Powder
T. Shobu, T. Muramatsu, K. Takase, E. Minehara, K. Tsukimori, Japan Atomic Energy Agency, Japan

11:40 AM
*Single Crystal Elastic Constants Of The MAX Phase Ti3AIC2 Determined By Neutron Diffraction
O. Kirstein, J. F. Zhang, E. Kisi, D. P. Riley, M. J. Styles, A. Paradowska, Australian Nuclear Science and Technology Organisation, Australia

12:00 PM
*Transmitted Imaging And Strain Mapping In The Vicinity Of Internal Crack Tip Using Synchrotron White X-Ray
Jun-ichi Shibano, Kentaro Kajiwara, Kouji Kiriyama, Takahisa Shobu, Kenji Suzuki, Suguru Nishimura, Setsuo Miura, Michiaki Kobayashi, Kitami Institute of Technology, Japan

12:20 PM
The Influence Of Thermal And Mechanical Load On The Residual Stress State In Cvd Multilayer Hard Coating Systems
M. Klaus, Ch. Genzel, H. Holzschuh, W. Reimers, Technische Universität Berlin, Germany

12:40 PM
*Simultaneous Determinationof Micro-Strain In Two Directions By Energy Dispersive Diffraction
Thomas Wroblewski, HASYLAB, Germany

1:00 PM
Residual Stress In Pvd-Coated Carbide Cutting Tools - Applications Of The Sin2y And The Scattering Vector Method
B. Breidenstein, B. Denkena, G. Erkens, Leibniz Universität Hannover, Germany

1:20 PM - 2:10 PM      Lunch Break

*Indicates Invited Paper

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Last updated:
August 14, 2009